Low-Temp Chip Tester

Used for detecting LD chip optoelectronic performance at low temperatures. Evaluates front and back LIV, spectral characteristics, and beam characteristics under low-temperature conditions. High-sealing chassis with precision temperature control supports rapid adjustment across -55°C~+100°C with ±0.1°C accuracy.

-55°C Extreme Low-Temp Control
High-sealing chassis enables rapid, precise extreme low-temperature adjustment.
Multi-Param Optoelectronic Analysis
Evaluates extinction ratio (ER), divergence angle, and more for EML and EML(SOA) chips.

Get a Quote

Models

SY-9100S Type Low-Temp Chip Tester (Universal)

SY-9200DGF Type Cross-Temperature Dual-Station Chip Tester

Specifications

Supported Chip Types

LD, FP, EML, EML(SOA), SLD

Chip Size Limits (L×W×H)

(150~1200)μm × (120~600)μm × (100±10)μm

Wavelength Range

600nm ~ 1700nm

Power Range

1μW ~ 300mW