1700 × 1200 × 2200 mm
Series Products
High-Power Chip Tester
Automated testing, determination, and sorting of high-power LD chip electrical and optical characteristics. Features a high-precision, high-stability fast temperature control system and various integrating sphere sizes for optical power sampling, ensuring reliable and repeatable test data.
Up to 30W Power Support
Designed for high-power devices, supporting reliable evaluation up to 30W.
Professional Integrating Sphere
Multiple integrating sphere sizes for optical power sampling ensure high-fidelity, reproducible data.
Models
SY-5100S Type High-Power Chip Tester
SY-5200S Type High-Power Chip Tester (Universal High/Low Power)
Specifications
Chip Size Limits (L×W×H)
(600~3000)μm × (250~400)μm × (100±10)μm
Wavelength Range
200nm ~ 1700nm
Power Range
1μW ~ 30W