Dual-Temp Chip Tester

Used for testing LD chip optoelectronic performance at normal and high temperatures (20°C~100°C). High-fidelity testing of front and back LIV, spectral, and beam characteristics with excellent repeatability.

±0.1°C Fast Temp Control
Precision temperature control system for high-accuracy rapid temperature adjustment.
Full Multi-Param LIV Analysis
Covers key metrics including threshold current, slope efficiency, and side-mode suppression ratio.

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Models

SY-8100D Type Chip Tester (Universal)

SY-7300DG Type Chip Tester (Universal)

Specifications

Supported Chip Types

LD, FP, EML, EML(SOA), SLD

Chip Size Limits (L×W×H)

(150~1200)μm × (120~600)μm × (100±10)μm

Wavelength Range

600nm ~ 1700nm

Power Range

1μW ~ 300mW