1060 × 1215 × 1715 mm
Series Products
APD Device Tester
The APD tester is used to detect the optoelectronic performance of APD chips under controlled temperature conditions, including dark current, responsivity, gain, and breakdown voltage. It covers both front and back chip surfaces and supports both dark-field and light-field test environments. Temperature control ranges from +25°C to +95°C with ±0.1°C precision.
Dark/Light Field Dual Environment
Covers front and back surfaces of APD chips, fully supporting both dark-field and light-field test environments.
High-Precision Wide Temp Control
Temperature range +25°C to +95°C with ±0.1°C precision, ensuring efficient and stable testing.
Models
SY-2000 Type APD Manual Tester
SY-2010BZD Type APD Semi-Automated Dual-Temp Tester
SY-2010QZD Type APD Fully Automated Wafer Tester
Specifications
Chip Size
Customizable per customer requirements