AOI Inspection Machine

Integrating microscopic optics and machine vision, this equipment detects defects on four chip surfaces in real time. It achieves precise recognition of microscopic defects down to 0.5 microns (0.1 microns/pixel). Based on deep learning, it accurately classifies defects including cracks, stains, chipping, coating peeling, waveguide damage, cleave fractures, scratches, uneven coating, indentations, gold layer delamination, missing characters, and uneven back-side gold deposition. High-precision anti-vibration platforms and microscope cameras ensure quality inspection across all HR, AR, P, and N surfaces.

Micron-Level Precision
Precise detection and identification of microscopic defects down to 0.5 microns (0.1 microns/pixel).
AI Deep Learning
Combines traditional algorithms with deep learning to accurately classify over ten common defect types, ensuring high accuracy and throughput.

Get a Quote

Models

SY-2501A Type Multi-Side AOI Inspection and Sorting Machine

SY-2502A Type Fully Automated Multi-Side AOI Inspection and Sorting Machine (Intelligent)

Specifications

Chip Size (L×W×H)

(200~1500)μm × (200~500)μm × (100±10)μm